Language : English
Tan Guojun

Paper Publications

Voltage division investigation of series short-circuit fault on SiC MOSFETs and Si IGBTs

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DOI number:10.1049/pel2.12374

Affiliation of Author(s):力学与土木工程学院

Funded by:其他课题

First Author:张经纬

Co-author:王强,张伟锋,Tan Guojun

Indexed by:Journal paper

Document Code:5b5bb29482f6cfe0018318029b31397e

ISSN No.:1755-4535

Translation or Not:no

Date of Publication:2022-08-01