Hits:

DOI number:10.1109/TIE.2022.3194599

Affiliation of Author(s):电气工程学院

Funded by:国家自然科学基金项目

First Author:张伟锋

Co-author:Tan Guojun,张旭,王强,张经纬

Indexed by:Journal paper

Document Code:5b5bb2948e416002018e6056cd745a84

Volume:70(6): 5474-5483

Translation or Not:no

Date of Publication:2022-08-03

Next One:Voltage division investigation of series short-circuit fault on SiC MOSFETs and Si IGBTs