基于光学显微的一点应变测量方法

Release time:2023-11-28 Hits:

School Sign:第一单位

Disigner of the Invention:代万里,吴培楠,王红英,韩贵雷,蒋斌松

Type of Patent:国内

State of Patent:专利授权

Application Number:202310167033.4

Service Invention or Not:no

Application Date:2023-02-27

Authorization Date:2023-10-03

First Author:zhangqiang