DOI number:10.1108/JIC-03-2019-0043

Journal:Journal of Intellectual Capital

Key Words:Individual intellectual capital, Self-reflection

Abstract:Abstract Purpose – The aim of this paper is to develop a tool measuring individual intellectual capital (IIC) and investigate the relationship between self-reflection and IIC. Design/methodology/approach – This study developed a theoretical model based on social cognitive theory and the literature of self-reflection and intellectual capital (IC). This research collected responses from 502 dyads of employees and their direct supervisors in 150 firms in China, and the study tested the research model using structural equation modeling (SEM). Findings – The results indicate that three components of self-reflection, namely, need for self-reflection, engagement in self-reflection and insight, significantly contribute to all the three components of IIC, such as individual human capital, individual structural capital and individual relational capital. The findings suggest that need for self-reflection is the weakest component to impact individual human capital and individual relationship capital, while insight is the one that mostly enhances individual structural capital. Practicalimplications-This paper suggests that managers can enhance employees’IIC by facilitating their self-reflection. Managers can develop appropriate strategies based on findings of this study, to achieve their specific goals. Originality/value – First, this study develops a tool for measuring IIC. Second, this study provides an enriched theoretical explanation on the relationship between self-reflection and IIC–by showing that the three subdimensions of self-reflection, such as need, engagement and insight, influence the three subdimensions of IIC, such as individual human capital, individual structural capital and individual relational capital.

Note:https://www.emerald.com/insight/1469-1930.htm

Indexed by:Journal paper

Volume:21

Issue:6

Page Number:1107-1124，第一且通讯作者

ISSN No.:1469-1930

Translation or Not:no

Date of Publication:2020-06-17

Included Journals:SSCI