Language : English
Tan Guojun

Paper Publications

SiC MOSFET串联短路动态特性

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DOI number:10.19595/j.cnki.1000-6753.tces.201432

Affiliation of Author(s):电气工程学院

Funded by:国家重点研发计划

First Author:张经纬

Co-author:张甜,冯源,宋明轩,Tan Guojun

Indexed by:Journal paper

Document Code:5b5bb29482f6cfe001831a5db5ec3a85

Volume:2021年12期:2446-2458,13

ISSN No.:1000-6753

Translation or Not:no

Date of Publication:2021-05-25